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TEST

Operation

Computes a bitwise conjunction and updates condition codes without storing the temporary value.

Assembler Syntax

TEST.{L|Q}(z) Rn(s), Rn(d)

TEST.{B|W|L|Q}(z) Rn(s), <ea>(e)

TEST.{B|W|L|Q}(z) <ea>(e), Rn(d)

Privilege

Unprivileged

Repeat eligibility

REP eligible; REPcc observes computed

Computes the selected-width bitwise conjunction only to set FLAGS.Z and FLAGS.N, clears FLAGS.C and FLAGS.V, and does not write the temporary result. The temporary conjunction supplies the REPcc observed value.

2.75in

Encodings

TEST.{L|Q}(z) Rn(s), Rn(d)

Format: Instruction format for TEST.{L|Q}(z) Rn(s), Rn(d)

Format: Instruction format for TEST.{L|Q}(z) Rn(s), Rn(d)

2.75in TEST.{B|W|L|Q}(z) Rn(s), <ea>(e)

Format: Instruction format for TEST.{B|W|L|Q}(z) Rn(s), <ea>(e)

Format: Instruction format for TEST.{B|W|L|Q}(z) Rn(s), <ea>(e)

2.75in TEST.{B|W|L|Q}(z) <ea>(e), Rn(d)

Format: Instruction format for TEST.{B|W|L|Q}(z) <ea>(e), Rn(d)

Format: Instruction format for TEST.{B|W|L|Q}(z) <ea>(e), Rn(d)